Process for manufacturing a silicon-on-insulator substrate and semiconductor devices on said substrate
US6368938B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 7, 2000 |
| Grant date | Apr 9, 2002 |
| Priority date | — |
| Expiry date | Jun 7, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/3226
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A process for manufacturing a silicon-on-insulator substrate and semiconductor devices on said substrate from thermally oxidized silicon wafer so that processing temperatures are limited to 900° C. is disclosed. The substrate is fabricated using H2 split process. Processing temperatures are limited to temperature of initiating of out-diffusion of oxygen from silicon dioxide into silicon. The limit prevents deterioration of buried oxide, and the oxide has low hole trap density that is equal to the trap density of an initial thermal silicon dioxide. Processing temperatures after implantation for H2 split process are limited to temperature of stability of dislocation microloops induced by the implantation at its damage peak. Resulting SOI structure have a gettering layer made from the microloops. The getter prevents yield drop caused by heavy metal contamination during the fabrication. Finished SOI devices have improved gate oxide integrity. Also, finished SOI circuitry has suppressed hot-electron controlled effects (backgating, transistor threshold voltage stability, side leakage). Also, radiation hardness of finished SOI devices is higher then the hardness of the SOI devices fab…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.