Integrated fuse latch and shift register for efficient programming and fuse readout
US6373771B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2001 |
| Grant date | Apr 16, 2002 |
| Priority date | — |
| Expiry date | Jan 17, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C19/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit device that obviates laser programming of a two-state element (e.g., a wire fuse or antifuse) by programming (i.e., changing) the conductive state of the two-state element according to a binary bit of programing data serially scanned in. Thereafter, the device can verify the actual programming of the two-state element by sensing the conducting condition and then serially scanning out the conductive state value of the two-sate element as a binary logic bit). The device provides the functionality of being able to test any on-chip non-memory circuitry that depends on a memory circuit being fully functional and operational while still at the wafer tester and before having to “blow” (i.e., program) any fuses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.