Patent · US Expired

Method of fabricating a micromechanical semiconductor configuration

US6379990B1 · kind B1 · utility

8Cited by
9References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 6, 1999
Grant dateApr 30, 2002
Priority date
Expiry dateJul 6, 2019

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2203/0136
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A membrane of the micromechanical semiconductor configuration is formed within a cavity. The membrane is formed by a crystalline layer within the substrate or within an epitaxial sequence of layers of the semiconductor configuration arranged on a substrate. The membrane is laid at the edge region on a support and is covered over by a covering layer supported on a counter-support. The support and the counter-support have a different etch rate from the membrane. Wet-chemical etching of the layer sequence with an etchant that is selective to the material of the membrane thus leads to the formation of a cavity around the membrane. Preferably, the layers are formed of differently doped materials.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.