Patent · US Expired

Method for manufacturing photoelectric conversion device

US6383898B1 · kind B1 · utility

33Cited by
6References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 25, 2000
Grant dateMay 7, 2002
Priority date
Expiry dateMay 25, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50

Abstract

A photoelectric conversion device including a plurality of pin junction layers, wherein at least a p-layer adjacent to an n-layer is formed of a stack of an amorphous silicon layer as a first p-layer and an amorphous silicon layer as a second p-layer, the first p-layer having a thickness of 5 nm or less and containing a p-type impurity and an n-type impurity, and the second p-layer having a p-type impurity concentration gradually decreasing as it is closer to an i-layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.