Patent · US Expired

Antifuse latch device with controlled current programming and variable trip point

US6384666B1 · kind B1 · utility

30Cited by
20References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 23, 2001
Grant dateMay 7, 2002
Priority date
Expiry dateMar 23, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A latch device is provided having a variable resistive trip point and controlled current programming. The latch device has a trip point current control element that controls an amount of current passing from a voltage source into the latch circuit, thereby varying the resistive trip point of the latch device. The latch device also has a programming current control element that controls an amount of programming current passing through the fuse element during programming. The trip point current reference and a programming current reference are provided by reference circuits having a plurality of selectable inputs that operate to change the current references binarily. An integrated circuit is also provided in which a plurality of the fuse latch devices are connected together in parallel such that the same trip point current reference and programming current reference are supplied to each latch device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.