Analyzing CMOS circuit delay
US6389577B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 1999 |
| Grant date | May 14, 2002 |
| Priority date | — |
| Expiry date | Mar 25, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/33
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and implementing system is provided in which input signal specifications, element internal delays and output loads, for each element in a circuit design, are utilized in an iterative processing engine to objectively determine and provide a timing rule database for a circuit being designed. A schematic database netlist is run through a test model converter program to provide a test model database at a gate level for the test model design circuit. These data are processed by a designer through a workstation GUI and the result is applied to an I/O design testing function. The results of the I/O design testing function include a listing of patterns of input combinations which are needed to get listed outputs. The GUI prepares a sequence of stimuli to test the circuit with a timing simulator. Based on the output response of the timing simulator, delay relationships under various input and output load conditions are compiled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.