Patent · US Expired

Process apparatus and method for improved plasma processing of a substrate

US6395095B1 · kind B1 · utility

5Cited by
14References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 15, 1999
Grant dateMay 28, 2002
Priority date
Expiry dateJun 15, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32706
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A processing system for processing a substrate comprises a process chamber having a top, a bottom, and a sidewall for defining a process space therein. The process chamber has an opening in the sidewall thereof for providing access to the process space. A plasma-generating assembly is coupled with the process chamber for creating a plasma within the process space. A substrate support assembly is configured for coupling with the process chamber to support a substrate within the process space. The substrate support assembly extends into the process space through the sidewall opening in the process chamber and seals the sidewall opening to generally isolate the process space from atmosphere.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.