Variable spacing probe tip adapter for a measurement probe
US6404215B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2000 |
| Grant date | Jun 11, 2002 |
| Priority date | — |
| Expiry date | Nov 28, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07364
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the probe head that extend radially from around each of the probe tips. Each of first and second first probing tips have an electrically conductive shaft that has a bore formed in one end for engaging the probe tips of the measurement probe. Each shaft has ribs and grooves formed therein that extend radially from the bore for engaging the corresponding grooves and ribs in the probe head. The other end of the conductive shaft tapers to a probing point with and a portion of the shaft toward the tapered end of the shaft being angled such that the probing tips. The conductive shafts are rotatable on measurement probe tips and locked into position by the engagement of the ribs and grooves in the probe head and the probing tips.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.