Method for identifying and correcting pixels with excess pixel lag in a solid state x-ray detector
US6404853B1 · kind B1 · utility
19Cited by
5References
23Claims
0Family size
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Key dates
| Filing date | Nov 2, 2001 |
| Grant date | Jun 11, 2002 |
| Priority date | — |
| Expiry date | Nov 2, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/482
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method is provided to identify pixels in a digital x-ray detector that experience an amount of residual charge that is sufficient to cause an image artifact. A lag artifact threshold is obtained. The lag artifact threshold identifies an amount of residual charge that, when held by the pixels in the digital x-ray detector, will cause image artifacts. A pixel lag experienced by a pixel is determined. The pixel lag may be different for each pixel. Pixels that have a pixel lag exceeding the lag artifact threshold are identified and corrected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.