Inventor · Waukesha, WI, US

John Moore Boudry

16Patents
6h-index
38Co-inventors
66Inventor score

Filing activity: Dec 22, 1998 → Sep 18, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US6404853B1 Method for identifying and correcting pixels with excess pixel lag in a solid state x-ray detector Human Necessities 19 Expired
US6919568B2 Method and apparatus for identifying composite defective pixel map Human Necessities 16 Expired
US9913620B2 Tilting head support for medical imaging Human Necessities 14 Active
US6115451A Artifact elimination in digital radiography Physics 10 Expired
US6400798B1 Simple means for measuring the offset induced by photo-conductive FETs in a solid state X-ray detector Physics 7 Expired
US6623161B2 Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector Human Necessities 6 Expired
US8265227B2 Apparatus and method for calibrating an X-ray tube Electricity 4 Active
US6618604B2 Method and apparatus for correcting the offset induced by field effect transistor photo-conductive effects in a solid state x-ray detector Electricity 3 Expired
US10555707B2 Patient support system and method for medical imaging Human Necessities 1 Active
US11039809B2 System and method for calibration of an X-ray tube Human Necessities 1 Active
US10670744B2 Current measurement in an imaging system Physics 0 Active
US11419566B2 Systems and methods for improving image quality with three-dimensional scout Human Necessities 0 Active
US12144672B2 System and method for autonomous identification of heterogeneous phantom regions Physics 0 Active
US11864941B2 System and method for collimator screening in a computed tomography system Human Necessities 0 Active
US12125662B2 Correction of intra-scan focal-spot displacement Electricity 0 Active
US12426841B2 System and method for a LIDAR guided patient positioning apparatus for a computed tomography system Human Necessities 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.