Method of fabricating HBT devices
US6406965B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 19, 2001 |
| Grant date | Jun 18, 2002 |
| Priority date | — |
| Expiry date | Apr 19, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/85
Abstract
A method of fabricating an HBT transistor with extremely high speed and low operating current. The transistor has a small base area and a small emitter area with most of the emitter area contacted with metal, most of the base area, outside of the emitter, contacted with metal and a collector ohmic metal placed close to the device emitter and the base ohmic metal. To achieve this, the method includes partially undercutting the base ohmic metal along all external edges to reduce the device's parasitic base-collector capacitance. In order to provide metal step coverage, the undercut of the base ohmic metal can be covered with a sloped edge polymer. In addition, a Schottky diode can be fabricated within the process steps used to form the HBT transistor without additional process steps being needed to build the Schottky diode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.