Patent · US Expired

Method for producing silicon nitride series film

US6413887B1 · kind B1 · utility

8Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2000
Grant dateJul 2, 2002
Priority date
Expiry dateSep 21, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/909
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for producing a plasma silicon nitride series film with a small heat load having a low hydrogen concentration is provided. The method is for producing a silicon nitride series film on a material to be treated using a plasma CVD apparatus having a reaction chamber evacuated to vacuum. The method comprises the steps of introducing a monosilane gas (SiH4) and a nitrogen gas (N2) as raw material gases into the reaction chamber at prescribed flow rates, and heating the material to be treated to a prescribed temperature. At this time, it is characterized in that the flow rate of the nitrogen gas is at least 100 times the flow rate of the monosilane gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.