ASM Japan K.K.
195Patents
85Active
195Granted
50Portfolio score
Filing activity: May 21, 1991 → Oct 2, 2014 · 67 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6383955B1 | Silicone polymer insulation film on semiconductor substrate and method for forming the film | Electricity | 713 | Expired |
| US6352945B1 | Silicone polymer insulation film on semiconductor substrate and method for forming the film | Emerging Cross-Sectional Technologies | 610 | Expired |
| US7919416B2 | Method of forming conformal dielectric film having Si-N bonds by PECVD | Electricity | 578 | Active |
| US8394466B2 | Method of forming conformal film having si-N bonds on high-aspect ratio pattern | Electricity | 572 | Active |
| US8669185B2 | Method of tailoring conformality of Si-containing film | Electricity | 566 | Active |
| US6455445B2 | Silicone polymer insulation film on semiconductor substrate and method for forming the film | Emerging Cross-Sectional Technologies | 566 | Expired |
| US7622369B1 | Device isolation technology on semiconductor substrate | Electricity | 564 | Active |
| US7651959B2 | Method for forming silazane-based dielectric film | Electricity | 563 | Active |
| US6435798B1 | Semiconductor processing apparatus with substrate-supporting mechanism | Emerging Cross-Sectional Technologies | 562 | Expired |
| US8329599B2 | Method of depositing dielectric film by ALD using precursor containing silicon, hydrocarbon, and halogen | Electricity | 551 | Active |
| US8173554B2 | Method of depositing dielectric film having Si-N bonds by modified peald method | Electricity | 550 | Active |
| US7972980B2 | Method of forming conformal dielectric film having Si-N bonds by PECVD | Electricity | 543 | Active |
| US7833353B2 | Liquid material vaporization apparatus for semiconductor processing apparatus | Chemistry; Metallurgy | 540 | Active |
| US6899507B2 | Semiconductor processing apparatus comprising chamber partitioned into reaction and transfer sections | Emerging Cross-Sectional Technologies | 532 | Expired |
| US6305898A | Wafer transfer mechanism | Electricity | 526 | Expired |
| US8592005B2 | Atomic layer deposition for controlling vertical film growth | Chemistry; Metallurgy | 525 | Active |
| US7021881B2 | Semiconductor processing apparatus comprising chamber partitioned into reaction and transfer sections | Emerging Cross-Sectional Technologies | 522 | Expired |
| US7963736B2 | Wafer processing apparatus with wafer alignment device | Emerging Cross-Sectional Technologies | 517 | Active |
| US8901016B2 | Method of forming metal oxide hardmask | Electricity | 517 | Active |
| US7618226B2 | Semiconductor substrate transfer apparatus and semiconductor substrate processing apparatus equipped with the same | Electricity | 517 | Active |
| US8647722B2 | Method of forming insulation film using plasma treatment cycles | Chemistry; Metallurgy | 516 | Active |
| US7825040B1 | Method for depositing flowable material using alkoxysilane or aminosilane precursor | Electricity | 514 | Active |
| US9171716B2 | Method of forming metal oxide hardmask | Electricity | 512 | Active |
| US6187691A | Method of forming film on semiconductor substrate in film-forming apparatus | Emerging Cross-Sectional Technologies | 511 | Expired |
| USD643055S1 | Heater block for use in a semiconductor processing tool | General | 508 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.