Patent · US Expired

Method and system for microwave excitation of plasma in an ion beam guide

US6414329B1 · kind B1 · utility

14Cited by
16References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 2000
Grant dateJul 2, 2002
Priority date
Expiry dateAug 4, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32678
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus and method for providing a low energy, high current ion beam for ion implantation applications are disclosed. The apparatus includes a mass analysis magnet mounted in a passageway along the path of an ion beam, a power source adapted to provide an electric field in the passageway, and a magnetic device adapted to provide a multi-cusped magnetic field in the passageway, which may include a plurality of magnets mounted along at least a portion of the passageway. The power source and the magnets may cooperatively interact to provide an electron cyclotron resonance (ECR) condition along at least a portion of the passageway. The multi-cusped magnetic field may be superimposed on the dipole field at a specified field strength in a region of the mass analyzer passageway to interact with an electric field of a known RF or microwave frequency for a given low energy ion beam. The invention further comprises a mass analyzer waveguide adapted to couple the electric field to the beam plasma consistently along the length of the mass analyzer passageway to thereby improve the creation of the ECR condition. The invention thus provides enhancement of beam plasma within a mass analyzer …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.