Patent · US Expired

Clock generation circuit generating internal clock of small variation in phase difference from external clock, and semiconductor memory device including such clock generation circuit

US6417715B2 · kind B2 · utility

51Cited by
6References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2001
Grant dateJul 9, 2002
Priority date
Expiry dateFeb 28, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/091
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A clock generation circuit includes a clock input circuit receiving complementary external clocks to generate an internal clock, a variable delay circuit delaying the internal clock to generate an internal operation clock, a replica circuit further delaying the internal operation clock by a predetermined time to generate a return clock, a phase comparator directly comparing the phase where potential levels of external clocks cross with the phase of the return clock, and a delay control circuit adjusting the delay amount of the variable delay circuit according to a phase comparison result of the phase comparator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.