Patent · US Expired

Programmable latch device with integrated programmable element

US6420925B1 · kind B1 · utility

59Cited by
5References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2001
Grant dateJul 16, 2002
Priority date
Expiry dateJan 9, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/18
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

According to the present invention, a programable latch device for use in personalizing a semiconductor device is provided that overcomes the limitations of the prior art. The preferred embodiment programmable latch device can use both fuses and antifuses as programmable elements. The programmable latch device provides a solid digital output indicative of the state of the programmable device, and can be reliably read to provide customization and personalization of associated semiconductor devices. The preferred embodiment programable latch device includes an integrated fuse or antifuse as a programmable element in the latch device. By integrating the programmable element into the latch, device size and complexity is minimized. In particular, the number of transistors required drops considerably when compared to prior art approaches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.