Patent · US Expired

Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatus

US6422088B1 · kind B1 · utility

72Cited by
8References
64Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 21, 2000
Grant dateJul 23, 2002
Priority date
Expiry dateJan 25, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R17/10
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A reference voltage generating circuit is constituted by resistors RE and RF each having a resistance not influenced by an application of pressure. The reference voltage generating circuit is connected between one and the other ends of a bridge circuit. A failure judgement of the bridge circuit is performed based on a comparison of a voltage difference VBC between two midpoints B and C of the bridge circuit and voltage differences VCE and VBE between a reference voltage level of the reference voltage generating circuit and the voltage levels of two midpoints B and C.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.