Patent · US Expired

Semiconductor module for burn-in test configuration

US6426640B1 · kind B1 · utility

2Cited by

2References

8Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Norbert Wirth · Unterschleißheim, DE
Eric Cordes · Isny im Allgäu, DE
Zoltan Manyoki · Gatineau, CA
Dominique Savignac · Ismaning, DE

Key dates

Filing date	Nov 15, 1999
Grant date	Jul 30, 2002
Priority date	—
Expiry date	Nov 15, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2884
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a semiconductor module for a burn-in test configuration. The semiconductor module has a regulator which, when it is turned on, always supplies a constant low voltage to an internal circuit of the semiconductor module. The semiconductor module also contains a component which, when the burn-in voltage has been applied for a defined time period, supplies a different characteristic than when the internal voltage is applied.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.