Patent · US Expired

Compact load lock system for ion beam processing of foups

US6428262B1 · kind B1 · utility

17Cited by
13References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 10, 2000
Grant dateAug 6, 2002
Priority date
Expiry dateAug 10, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/139
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The system processes one or more wafers from a FOUP to an ion processing chamber. A group of wafers from the FOUP is removed by a first end effector and loaded into a load lock through a lower door in an atmosphere opened position. The load lock is sealed, evacuated, and an upper door is opened to a vacuum opened position. A second end effector connected to a 3-axis robot moves one of the wafers from the load lock to the ion processing chamber. A wafer alignment robot can also be used. Wafers are sequentially processed from the load lock to the processing chamber until complete; and then the wafers within the load lock are sealed, pressurized, and moved back to the FOUP. A second load lock, and multiple FOUPs, are used to increase throughput.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.