Patent · US Expired

Dual trench isolation for a phase-change memory cell and method of making same

US6437383B1 · kind B1 · utility

205Cited by
2References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 21, 2000
Grant dateAug 20, 2002
Priority date
Expiry dateDec 21, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N70/8828
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a phase-change memory device. The device includes a double-trench isolation structure around the diode stack that communicates to the lower electrode. The present invention also relates to a method of making a phase-change memory device. The method includes forming two orthogonal and intersecting isolation trenches around a memory cell structure diode stack.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.