Patent · US Expired

Embedded type flash memory structure and method for operating the same

US6441443B1 · kind B1 · utility

29Cited by
7References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 13, 2001
Grant dateAug 27, 2002
Priority date
Expiry dateFeb 13, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/0416
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention provides an embedded type flash memory structure and a method for operating the same. The memory structure of the present invention comprises a first deep doped-region formed on the surface of a semiconductor substrate. A second doped-region is implanted in the first deep doped-region. A plurality of first shallow doped-regions are respectively formed in the second doped-region and the first deep doped-region to be used as drains and sources. A dielectric insulating layer and a poly-silicon gate are stacked above the first deep doped-region between the source and the drain. The present invention also proposes programming, erasing, and reading processes corresponding to the flash memory cell structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.