Patent · US Expired

Method and apparatus for etching silicon

US6444589B1 · kind B1 · utility

7Cited by
2References
13Claims
0Family size

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Inventors

Key dates

Filing dateJul 13, 2000
Grant dateSep 3, 2002
Priority date
Expiry dateJul 18, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6708
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An etching method and an etching apparatus for applying an etchant containing nitric acid and hydrofluoric acid to silicon to etch the silicon. The etchant used in etching is recovered, and brought into contact with a gas inert to the etchant, whereby the etchant is regenerated. At least a part of the regenerated etchant is reused in etching.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.