Patent · US Expired

Iddq-testable uni-directional master-slave

US6445235B1 · kind B1 · utility

8Cited by
3References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 5, 1995
Grant dateSep 3, 2002
Priority date
Expiry dateAug 9, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318577
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A flipflop has master and slave interconnected through a buffer. The master has its inverters located outside the signal path from input to output, as the buffer provides the driving capability required for both IDDQ-testing and operational use. This configuration enables IDDQ-testing without further circuitry added to the flipflop and reduces propagation delay in the signal path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.