Programmable pulse generator and method for using same
US6446226B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 26, 2000 |
| Grant date | Sep 3, 2002 |
| Priority date | — |
| Expiry date | Dec 26, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31919
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system is described for providing pulses to test a semiconductor device, such as a memory device. The system includes several voltage sources, each voltage source being coupled to an output terminal through a pass gate. A control logic circuit provides a control signal to each of the pass gates to render the pass gates conductive in a sequence. A voltage generated by each voltage source is coupled to the output terminal in a sequence to generate a series of pulses at the output terminal. Each of the voltage sources may be a programmable digital-to-analog converter receiving a voltage control signal and generating a voltage based on the voltage control signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.