Method of measuring the accuracy of parasitic capacitance extraction
US6449754B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 24, 2000 |
| Grant date | Sep 10, 2002 |
| Priority date | — |
| Expiry date | Mar 24, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A technique measuring accuracy of parasitic capacitance extraction defines the error in an extracted total net parasitic capacitance intended for timing analysis as a sum of the errors in the extracted values of the individual capacitance elements, with the error for each element being influenced by a weight factor. Similarly, the technique defines an error in the extracted value of a crosstalk factor for the net of interest as a difference between the errors in the extracted values of the individual capacitance elements, with the error in each element being influenced by a weight factor. For signal timing and crosstalk analyses, the weight factors allow a designer to focus calibration of the extraction tool on the capacitive element having the highest weight factor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.