Attachable/detachable probing point
US6459287B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 18, 2001 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | May 18, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06788
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An attachable/detachable probe point for use with an electrical measurement probe includes a base having a aperture formed therein that extends through the base. An electrically conductive probing contact having at least a partially threaded body member and a pointed contact member is disposed in the aperture with a portion of the body member extending from the top surface of the base and the pointed contact member extendable from a first position within the aperture to a second protruding position outside the aperture at the bottom surface of the base. A compliant adhesive material formed on the bottom surface of the base for securing the attachable/detachable probe point to probing contact point.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.