Combinatorial X-ray diffractor
US6459763B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 26, 2001 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | Mar 26, 2021 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB01J2219/00756
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A combinatorial X-ray diffractor, particularly a combinatorial X-ray diffractor which can measure one row of samples among a plurality of samples arranged into a matrix simultaneously by X-ray diffraction. For the purpose of high throughput screening, a plurality of samples (10) are arranged into a row X1, a row X2, a row X3, and a row X4 on a sample stage and samples in each row are measured simultaneously by X-ray diffraction, measured data are processed by an information processor (20), information data useful for the evaluation of thin film material are automatically extracted and arranged and the extracted and arranged information data are displayed on a display apparatus (27).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.