Patent · US Expired

Dual on-chip and in-package clock distribution system

US6463547B1 · kind B1 · utility

18Cited by
4References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 8, 1999
Grant dateOct 8, 2002
Priority date
Expiry dateDec 8, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F1/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A clock distribution system for a semiconductor device provides for both on-chip and in-package clock distribution via on-chip and in-package clock distribution networks. Each of these networks is selectively enabled depending on the mode of operation. Specifically, for wafer testing, the on-chip clock distribution network is selected. Thus, a probe tester need only provide a single clock source with conventional timing specifications to test the operation of the chip. In contrast, during normal operation, an in-package clock distribution network is enabled. In-package clock routing provides the lowest variation mode and thus, will result in the maximum clock frequency for the chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.