IC socket and IC tester
US6464511B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2001 |
| Grant date | Oct 15, 2002 |
| Priority date | — |
| Expiry date | Feb 22, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R2201/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A housing and a bottom cover are secured together and have pairs of aligned through-apertures, and probe pins are accommodated in respective pairs of through-apertures to provide an IC socket. Each probe pin comprises a tube having a stop flange formed around its outer periphery, a movable plunger accommodated in the tube such that an extension portion of the movable plunger in urged to project out of a narrowed first end portion of the tube by a first coil spring, and a fixed plunger fitted to a second end portion of the tube. Each probe pin is urged by a second coil spring such that the stop flange on the tube is urged into abutment with a shoulder portion of a through-aperture of the bottom cover, whereby a tip end of the fixed plunger is projected beyond the outer surface of the bottom cover and a tip end of the movable plunger is projected beyond the outer surface of the housing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.