Patent · US Expired

Semiconductor wafer dividing method

US6465158B1 · kind B1 · utility

129Cited by
0References
5Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 19, 2000
Grant dateOct 15, 2002
Priority date
Expiry dateNov 27, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/78
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor wafer dividing method for dividing a semiconductor wafer, on whose face side many rectangular areas are demarcated by streets arranged in a lattice fashion, along the streets to convert each of the many rectangular areas into a semiconductor chip. In this method, a resist is formed on the face side of the semiconductor wafer. Then, the resist is physically removed in areas extending along the streets. Then, an etching process is applied to the semiconductor wafer to etch the semiconductor wafer along the streets.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.