Patent · US Expired

Magnetic element with an improved magnetoresistance ratio and fabricating method thereof

US6469926B1 · kind B1 · utility

111Cited by
3References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 22, 2000
Grant dateOct 22, 2002
Priority date
Expiry dateMar 22, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11B5/3909
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An improved and novel magnetic element and fabrication method. The magnetic element (10;30) including a bottom pinned ferromagnetic layer (12;32) and a top pinned ferromagnetic layer (20;40) fabricated antiparallel to one another. The magnetic element (10;30) further including a bottom tunnel barrier layer (14;34), a free ferromagnetic layer (16;46 and 48) and a top tunnel barrier layer (18;38) formed between the bottom pinned ferromagnetic layer (12;32) and the top pinned ferromagnetic layer (20;40). The structure is defined as including two (2) tunnel barrier layers in which one tunnel barrier layer is normal (18) and one is reversed (14), or a structure in which the two tunnel barrier layers are of the same type (34; 38) with the structure further includes a SAF structure (36) to allow for consistently changing magnetoresistance ratios across both tunnel barriers. The magnetic element (10;30) having an improved magnetoresistance ratio and a decrease in voltage dependence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.