Defect screening using delta VDD
US6476631B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 29, 2001 |
| Grant date | Nov 5, 2002 |
| Priority date | — |
| Expiry date | Jun 29, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing a series of functional blocks within an integrated circuit. Each of the functional blocks in the series is tested to determine a minimum parameter value and a maximum parameter value associated with each of the functional blocks. A minimum parameter delta value is calculated for each of the functional blocks in the series. The minimum parameter delta value is the minimum parameter value associated with a given one of the functional blocks subtracted from the minimum parameter value for a functional block immediately following the given one of the functional blocks in the series. A maximum parameter delta value is also calculated for each of the functional blocks in the series. The maximum parameter delta value is the maximum parameter value associated with the given one of the functional blocks subtracted from the maximum parameter value for the functional block immediately following the given one of the functional blocks in the series. The minimum parameter delta value is compared to a minimum parameter delta value tolerance limit and the maximum parameter delta value is compared to a maximum parameter delta value tolerance limit. The integrated circuit is sel…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.