Robert Madge
17Patents
7h-index
12Co-inventors
59Inventor score
Filing activity: Apr 5, 1988 → Nov 23, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6807655B1 | Adaptive off tester screening method based on intrinsic die parametric measurements | Electricity | 87 | Expired |
| US4905230A | Token ring expander and/or hub | Electricity | 47 | Expired |
| US6598194B1 | Test limits based on position | Physics | 21 | Expired |
| US4985888A | Token ring system hierarchy | Electricity | 12 | Expired |
| US6601008B1 | Parametric device signature | Electricity | 11 | Expired |
| US6943042B2 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Electricity | 9 | Expired |
| US6787379B1 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Electricity | 8 | Expired |
| US7073107B2 | Adaptive defect based testing | Physics | 4 | Expired |
| US6682947B1 | Feed forward testing | Physics | 4 | Expired |
| US6782500B1 | Statistical decision system | Physics | 3 | Expired |
| US7079963B2 | Modified binary search for optimizing efficiency of data collection time | Emerging Cross-Sectional Technologies | 3 | Expired |
| US6647348B2 | Latent defect classification system | Physics | 2 | Expired |
| US6931297B1 | Feature targeted inspection | Physics | 2 | Expired |
| US6476631B1 | Defect screening using delta VDD | Physics | 2 | Expired |
| US6624048B1 | Die attach back grinding | Emerging Cross-Sectional Technologies | 1 | Expired |
| US6532431B1 | Ratio testing | Physics | 1 | Expired |
| US7305634B2 | Method to selectively identify at risk die based on location within the reticle | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.