Patent · US Expired

Method and device for transferring wafers

US6481945B1 · kind B1 · utility

503Cited by
10References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 5, 2000
Grant dateNov 19, 2002
Priority date
Expiry dateDec 5, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Enhanced inserts are formed having a cylindrical grip and a protrusion extending from the grip. An ultra hard material layer is bonded on top of the protrusion. The inserts are mounted on a rock bit and contact the earth formations off center. The ultra hard material layer is thickest at a critical zone which encompasses a major portion of the region of contact between the insert and the earth formation. Transition layers may also be formed between the ultra hard material layer and the protrusion so as to reduce stresses formed on the interface between the ultra hard material and the protrusion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.