Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using it
US6487700B1 · kind B1 · utility
78Cited by
2References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 8, 2000 |
| Grant date | Nov 26, 2002 |
| Priority date | — |
| Expiry date | Mar 8, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Herein disclosed is a semiconductor device simulation apparatus which is set the various parameters to be used for measuring a current value and a voltage value that varies depending on the internal resistance of a DUT, and simulates a current value or a voltage value that varies depending on an internal resistance of a DUT in accordance with various parameters and a prescribed test signal when receiving the test signal. Also disclosed is a semiconductor test program debugging apparatus using such a semiconductor device simulating apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.