Method and circuit for testing high frequency mixed signal circuits with low frequency signals
US6492798B2 · kind B2 · utility
34Cited by
10References
33Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 27, 2001 |
| Grant date | Dec 10, 2002 |
| Priority date | — |
| Expiry date | Apr 27, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3167
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing an analog, or mixed analog and digital, circuit designed for operation at a clock frequency multiplexes a plurality of low frequency stimulus signals using a high frequency clock to produce a circuit input signal, applies the input signal to the circuit to obtain a circuit output signal; samples the circuit output signal synchronously with the high frequency clock at a frequency equal to the clock frequency divided by the number of the low frequency signals; stores the samples and measures properties of the signal samples to determine properties of the output signal of the circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.