Method and apparatus for measuring an optical transfer characteristic
US6493074B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 6, 2000 |
| Grant date | Dec 10, 2002 |
| Priority date | — |
| Expiry date | Jan 6, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There are provided an optical transfer characteristic measuring method and apparatus capable of measuring an optical transfer characteristic of an optical device on optical frequency axis in wide optical frequency bandwidth with high resolution. There are provided a variable wavelength sweep type light source capable of switching the wavelength of an optical signal generated therefrom stepwise and sweeping the optical frequency of the optical signal in a predetermined frequency range, and a variable wavelength reference light source capable of switching the wavelength of an optical signal generated therefrom stepwise and not capable of sweeping the optical frequency of the optical signal. Optical signals having their wavelengths sequentially switched to corresponding specified wavelengths are generated from the variable wavelength sweep type light source, and also a sweep of the optical frequency of each optical signal having the corresponding specified wavelength is carried out over the predetermined frequency range, until the number of occurrences of the optical signals reaches a preset number of times. After the measurement of the optical transfer characteristic has been complet…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.