Patent · US Expired

Contact structure and production method thereof and probe contact assembly using same

US6504223B1 · kind B1 · utility

11Cited by
4References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 2000
Grant dateJan 7, 2003
Priority date
Expiry dateSep 16, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/4015
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has a tip portion at one end of the contactor to contact with the contact target, a base portion at another end of the contactor which is inserted in a through hole provided on the contact substrate in such a way that an end of the contactor functions as a contact pad for electrical connection at a surface of the contact substrate, and a spring portion provided between the tip portion and the base portion which produces a contact force when the contactor is pressed against the contact target.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.