Method and a device for measuring an analog voltage in a non-volatile memory
US6507183B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2000 |
| Grant date | Jan 14, 2003 |
| Priority date | — |
| Expiry date | Jun 29, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Presented is an analog voltage value measuring device for measuring any of a set of voltage references that are generated inside a memory architecture. The selected voltage to be measured is connected to a facility line through a multiplexer. The memory architecture includes a set of output buffers connected to a respective set of output pads. The device also includes a converter block, connected between the facility line and the output buffers of the memory architecture for converting a measured analog value of a voltage reference selected by the multiplexer to a digital value, which is presented on the output pads. A method of measuring an analog voltage value in a memory device is also disclosed. The method includes selecting an analog voltage value from the set of voltage values; transferring the selected analog value onto the facility line; converting the selected analog value to a digital value; and presenting the digital value on the output pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.