Fast test application switching method and system
US6512988B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | May 25, 2000 |
| Grant date | Jan 28, 2003 |
| Priority date | — |
| Expiry date | May 25, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2733
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP) and at least two format dependent portions (FDPs) that are specific to the particular format to be tested. The FIP is configured to be compatible with each of the format dependent portions so that any of the format dependent portions can utilize the FIP to perform testing tasks. When a first format test request is received, the FIP activates the virtual instruments associated with the first format. Then, when a second format test request is received, the FIP de-activates the virtual instruments associated with the first format and activates the virtual instruments associated with the second format. A first mechanism is provided for maintaining a plurality of settings associated with while the format dependent portion is inactive. This mechanism also automatically applies these settings to the format dependent portion when the format dependent portion is activated. A second mechanism is p…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.