Kerwin D. Kanago
2Patents
2h-index
5Co-inventors
27Inventor score
Filing activity: May 28, 1999 → May 25, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6587671B1 | RF test set with concurrent measurement architecture | Electricity | 38 | Expired |
| US6512988B1 | Fast test application switching method and system | Physics | 10 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.