Patent · US Expired

Method for characterizing samples on the basis of intermediate statistical data

US6515289B1 · kind B1 · utility

14Cited by
10References
89Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 10, 1999
Grant dateFeb 4, 2003
Priority date
Expiry dateDec 10, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/6458
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for characterizing a sample involves: a) monitoring the sample for intensity fluctuations of radiation emitted, scattered and/or reflected by units of the sample in at least one measurement volume with at least one detector which is able to detect radiation emitted, scattered and/or reflected by the units, b) determining from the intensity fluctuations intermediate statistical data of an at least two-dimensional joint statistical function, and c) determining information related to a joint distribution of the units out of the intermediate statistical data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.