Method for characterizing samples on the basis of intermediate statistical data
US6515289B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 10, 1999 |
| Grant date | Feb 4, 2003 |
| Priority date | — |
| Expiry date | Dec 10, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6458
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing a sample involves: a) monitoring the sample for intensity fluctuations of radiation emitted, scattered and/or reflected by units of the sample in at least one measurement volume with at least one detector which is able to detect radiation emitted, scattered and/or reflected by the units, b) determining from the intensity fluctuations intermediate statistical data of an at least two-dimensional joint statistical function, and c) determining information related to a joint distribution of the units out of the intermediate statistical data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.