Inventor · Tallinn, EE

Peet Kask

17Patents
4h-index
10Co-inventors
57Inventor score

Filing activity: Nov 10, 1997 → Apr 23, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US6690463B2 Fluorescence intensity and lifetime distribution analysis Physics 21 Expired
US6515289B1 Method for characterizing samples on the basis of intermediate statistical data Physics 14 Expired
US9192348B2 Method and system for automated detection of tissue interior to a mammalian ribcage from an in vivo image Physics 6 Active
US6122098A Confocal microscope for optical determination of an observation volume Physics 4 Expired
US8269965B2 Method of analysis of samples by determination of a function of specific brightness Physics 3 Active
US9612428B2 Apparatus for confocal observation of a specimen Physics 2 Active
US8600144B2 Methods and apparatus for image analysis using profile weighted intensity features Physics 2 Active
US6407856B1 Confocal microscope for optical determination of an observation volume Physics 2 Expired
US9443129B2 Methods and apparatus for image analysis using threshold compactness features Physics 1 Active
US8705834B2 Methods and apparatus for image analysis using threshold compactness features Physics 1 Active
US10178982B2 System and methods for automated segmentation of individual skeletal bones in 3D anatomical images Physics 1 Active
US11182913B2 Systems and methods for automated distortion correction and/or co-registration of three-dimensional images using artificial landmarks along bones Physics 1 Active
US8942459B2 Methods and apparatus for fast identification of relevant features for classification or regression Physics 1 Active
US9999400B2 Systems and methods for automated segmentation of individual skeletal bones in 3D anatomical images Physics 1 Active
US7019310B2 Method of analysis of samples by determination of a function of specific brightness Physics 1 Expired
US11080830B2 Systems and methods for segmentation and analysis of 3D images Physics 1 Active
US6965113B2 Fluorescence intensity multiple distributions analysis: concurrent determination of diffusion times and molecular brightness Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.