Patent · US Expired

Method and apparatus for controlling a pad conditioning process of a chemical-mechanical polishing apparatus

US6517414B1 · kind B1 · utility

55Cited by
45References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 2000
Grant dateFeb 11, 2003
Priority date
Expiry dateMar 10, 2020

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B49/16
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method and apparatus for improving the pad conditioning process of a polishing pad in a chemical-mechanical polishing apparatus employs closed loop control of the polishing pad conditioning process. An arrangement includes a pad conditioning head carried by an arm that is coupled to an arm support located remotely from the conditioning head. A down force sensor in the arm support measures the down force exerted by the pad conditioning head through the conditioning disk. A controller receives the down force measurements from the down force sensor and controls the arm support to controllably vary the down force exerted by the pad conditioning head. The conditioning apparatus is thus controlled in response to the feedback from the down force measurements in a closed loop control to modify the conditioning process and control the pad wear uniformity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.