Patent · US Expired

Method of forming an insulating zone

US6518114B2 · kind B2 · utility

3Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 23, 2001
Grant dateFeb 11, 2003
Priority date
Expiry dateMar 23, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76224
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a method of forming an insulating zone (14) around an active zone (12) in a semiconductor substrate, which method includes the following steps: forming a groove around an active zone (12) in the substrate; and filling the groove with a first material so as to form around the active zone an insulating zone (14) which projects from the surface of the substrate and forms a vertical protrusion at its periphery; and blunting the angle of the protrusion of the insulating zone at the periphery at the active zone. The invention further relates to a semiconductor device formed using said method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.