Meindert Martin Lunenborg
7Patents
2h-index
19Co-inventors
44Inventor score
Filing activity: Mar 23, 2001 → Jul 11, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6746935B2 | MOS transistor in an integrated circuit and active area forming method | Electricity | 3 | Expired |
| US6518114B2 | Method of forming an insulating zone | Electricity | 3 | Expired |
| US8066430B2 | Semiconductor substrate temperature determination | Physics | 2 | Active |
| US9691669B1 | Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Physics | 2 | Active |
| US6561839B2 | Process for forming shallow isolating regions in an integrated circuit and an integrated circuit thus formed | Electricity | 0 | Expired |
| US10852337B2 | Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Physics | 0 | Active |
| US10643735B1 | Passive array test structure for cross-point memory characterization | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.