Method and apparatus to change the amount of redundant memory column and fuses associated with a memory device
US6519202B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2001 |
| Grant date | Feb 11, 2003 |
| Priority date | — |
| Expiry date | Jun 29, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/808
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system, and apparatus exist which couple a first group of non-redundant memory columns to a non-redundant input-output circuit and couple a second group of redundant memory columns to a redundant input-output circuit. A fewer amount of memory columns exist in the second group of redundant memory columns than in the first group of non-redundant memory columns. A first fuse indicates whether one or more memory columns are defective in a group of non-redundant memory columns coupled to the non-redundant input output circuit. Also, a second fuse couples to a first circuit. The first circuit identifies which sub-input-output circuit is coupled to the one or more defective memory columns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.