Jitter measuring device and method
US6522122B2 · kind B2 · utility
32Cited by
2References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2001 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Jan 29, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03L7/091
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal to be measured is waveform-formatted to a square waveform that retains the frequency, duty ratio and jitter component of the original signal, and the leading (or trailing) edge of the waveform-formatted output is sampled by a sampling clock of a frequency slightly different from 1/N of the frequency fM of the signal to be measured. The samples are converted by an A/D converter to digital data Vn(t), which is stored in a memory. The difference between the stored digital data Vn(t) and the rise-up characteristic line V′(t) is calculated to detect jitter J′n(t).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.