Test system and associated interface module
US6522162B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2002 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Apr 24, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2886
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system includes (a) a tester mechanism (16 and 42) having tester contacts (152) for carrying test signals, (b) an interface module (44), and (c) a device-side board (46) having device-side contacts (162) for connection to external leads of an electronic device (40) under test. The interface module contains a tester-side body (50) having tester-side openings (86) for being positioned opposite the tester contacts, a device-side body (52) having device-side openings (136) for being positioned opposite the device-side contacts, and interface conductors (54) extending through the tester-side and device-side openings for connecting the tester contacts to the device-side contacts. The tester body is configured, typically as at least five wedge-shaped portions (68), in such a manner as to enable the electronic device under test to have an increased number of external leads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.