NPTest, Inc.
🏢 View company profile →17Patents
0Active
17Granted
32Portfolio score
Filing activity: Oct 17, 1999 → May 15, 2003
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6661836B1 | Measuring jitter of high-speed data channels | Electricity | 62 | Expired |
| US6744267B2 | Test system and methodology | Physics | 23 | Expired |
| US6748564B1 | Scan stream sequencing for testing integrated circuits | Physics | 18 | Expired |
| US6672947B2 | Method for global die thinning and polishing of flip-chip packaged integrated circuits | Electricity | 17 | Expired |
| US6940271B2 | Pin electronics interface circuit | Physics | 12 | Expired |
| US6781218B1 | Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrate | Electricity | 9 | Expired |
| US6622107B1 | Edge placement and jitter measurement for electronic elements | Physics | 8 | Expired |
| US6775637B2 | Test method and apparatus for source synchronous signals | Physics | 7 | Expired |
| US6794861B2 | Method and apparatus for socket calibration of integrated circuit testers | Physics | 6 | Expired |
| US6522162B2 | Test system and associated interface module | Physics | 5 | Expired |
| US6855622B2 | Method and apparatus for forming a cavity in a semiconductor substrate using a charged particle beam | Electricity | 5 | Expired |
| US6853941B2 | Open-loop for waveform acquisition | Physics | 4 | Expired |
| US6630667B1 | Compact, high collection efficiency scintillator for secondary electron detection | Electricity | 4 | Expired |
| US6822435B2 | Comparator circuit for differential swing comparison and common-mode voltage comparison | Physics | 2 | Expired |
| US6760223B2 | Apparatus and method for contacting device with delicate light-transparent pane | Physics | 2 | Expired |
| US6872581B2 | Measuring back-side voltage of an integrated circuit | Electricity | 1 | Expired |
| US6737853B2 | Photoconductive-sampling voltage measurement | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.